Abstract
IN the course of work on vacuum bolometers, it has been noticed that films of bismuth evaporated on to a backing film of celluloid (both with thickness of the order of 1 micron) possessed a negative resistance-temperature coefficient. In order further to study the property, films of bismuth were evaporated on to microscope slides, washed and wiped but not otherwise cleaned. In every case these showed a negative resistance-temperature coefficient, which diminished with increasing thickness of film.
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References
Baker, E. B., and Robb, C. D., Rev. Sci. Inst., 14, 356 (1943).
Amdur, I., and Glick, C. F., Rev. Sci. Inst., 16, 117 (1945).
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TULLEY, T. Negative Resistance-Temperature Coefficient of Thin Evaporated Films of Bismuth. Nature 157, 372 (1946). https://doi.org/10.1038/157372a0
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DOI: https://doi.org/10.1038/157372a0
