Abstract
AN A.E.I. mass spectrometer, type M.S.2/S., fitted with an electron multiplier and having a triple tungsten filament as source for the thermal ionization of solids is being used for measurements of the abundance of silicon isotopes.
This is a preview of subscription content, access via your institution
Access options
Subscribe to this journal
Receive 51 print issues and online access
$199.00 per year
only $3.90 per issue
Buy this article
- Purchase on SpringerLink
- Instant access to the full article PDF.
USD 39.95
Prices may be subject to local taxes which are calculated during checkout
Similar content being viewed by others
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
NEWTON, D., SANDERS, J. & TYRRELL, A. Isotopic Analysis of Silicon by Solid-Source Mass Spectrometry using Negative Ions. Nature 187, 683 (1960). https://doi.org/10.1038/187683a0
Issue date:
DOI: https://doi.org/10.1038/187683a0
