Abstract
To obtain the integrated absorption strength of a narrow spectral line by direct spectrophotometric measurement high resolution is necessary and the resultant profile must be corrected for finite instrumental resolution. As an alternative, dispersion data at much lower resolution may be used to obtain line strengths, and we report some measurements on a few of the low J rotational transitions in the halogen halides.
This is a preview of subscription content, access via your institution
Access options
Subscribe to this journal
Receive 51 print issues and online access
$199.00 per year
only $3.90 per issue
Buy this article
- Purchase on SpringerLink
- Instant access to full article PDF
Prices may be subject to local taxes which are calculated during checkout
Similar content being viewed by others
References
Chamberlain, J. E., Gibbs, J. E., and Gebbie, H. A., Nature, 198, 874 (1963).
Chamberlain, J. E., Findlay, F. D., and Gebbie, H. A., Applied Optics (to be published).
Schurin, B., and Rollefson, R., J. Chem. Phys., 26, 1089 (1957).
Chamberlain, J. E., Infra-red Physics (to be published).
Jones, G., and Gordy, W., Phys. Rev., 136, A1229 (1964).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
CHAMBERLAIN, J., GEBBIE, H. Sub-millimetre Dispersion and Rotational Line Strengths of the Hydrogen Halides. Nature 208, 480–481 (1965). https://doi.org/10.1038/208480a0
Issue date:
DOI: https://doi.org/10.1038/208480a0
