Abstract
VERY high precision has been obtained in the measurement of X-ray diffraction angles, such that if translated into terms of changes in the crystal lattice constant, a precision of 1 part in 10,000,000 can be attained. All indications are that the limit of sensitivity can be extended even further. Fig. 1 shows the application of the method to measurements of the coefficient of thermal expansion of magnesium oxide over a temperature range of 1° C, and gives a clear idea of the sensitivity that is at present being obtained.
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References
Bond, W. L., Acta Cryst., 13, 814 (1960).
Bragg, W. H., and Bragg, W. L., X-rays and Crystal Structure (G. Bell and Sons, London); 1915 ed., 29 and 30; 1925 ed., 23.
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BAKER, T., GEORGE, J., BELLAMY, B. et al. Very High Precision X-ray Diffraction. Nature 210, 720–721 (1966). https://doi.org/10.1038/210720a0
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DOI: https://doi.org/10.1038/210720a0
