Abstract
STUDIES of service failures, such as fractures, are often inadequate because they are made after the event; in the laboratory failures can be observed as they happen. High speed photography allows study of crack propagation—Fig. 1 shows stages in cracking of tungsten at velocities of 2 km s−1—but magnifications are limited. Less brittle solids fracture more slowly and allow high magnification studies; here I describe a technique which allows study of crack growth and other failure processes by scanning electron microscopy.
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References
Dobbs, H. S., Field, J. E., and Heyes, A. D., Proc. Eighth Int. Cong. High Speed Photography, Stockholm, 435 (1968).
Gane, N., and Bowden, F. P., J. Appl. Phys., 39, 1432 (1968).
Dingley, D. J., Micron, 1, 206 (1969).
Forsyth, P. J. F., and Wilson, R. N., J. Sci. Instrum., 37, 37 (1960).
Pashley, D. W., in Modern Developments in Electron Microscopy, 226 (Academic Press, London and New York, 1964).
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DOBBS, H. A Simple Microtensometer for Use in Scanning Electron Microscopes. Nature 240, 462–463 (1972). https://doi.org/10.1038/240462a0
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DOI: https://doi.org/10.1038/240462a0


