Abstract
SMALL bright spots (0.3–0.7 nm) have been observed in the dark field images of evaporated carbon films1 but their origin has not been explained. Here I suggest that these bright spots are present in the dark field image at an over-focus (a higher objective lens current) of 300 nm±50 nm relative to the bright field focus (the finest granulation in the phase structure).
This is a preview of subscription content, access via your institution
Access options
Subscribe to this journal
Receive 51 print issues and online access
$199.00 per year
only $3.90 per issue
Buy this article
- Purchase on SpringerLink
- Instant access to full article PDF
Prices may be subject to local taxes which are calculated during checkout
Similar content being viewed by others
References
Thon, F., Proc. Fourth Europ. Conf. Electron Microsc., 1, 127 (1968).
Thon, F., Z. Naturf., 21 A, 476 (1966).
Brakenhoff, G. J., Nanninga, N., and Pieters, J., J. Ultrastruct. Res., 41, 238 (1972).
Jenkins, F. A., and White, H. E., Fundamentals of Optics (McGrawHill, New York, 1957).
Ban, L. L., and Hess, W. M., Proc. Twenty-sixth Ann. Mtg EMSA, 256 (Claitor, Baton Rouge, 1968).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
BRAKENHOFF, G. Origin of Bright Spots in High Resolution Dark Field Electron Microscopy. Nature 243, 512 (1973). https://doi.org/10.1038/243512a0
Received:
Revised:
Issue date:
DOI: https://doi.org/10.1038/243512a0
