Figure 1 | NPG Asia Materials

Figure 1

From: Highly flexible and robust N-doped SiC nanoneedle field emitters

Figure 1

(a1–a3) Typical scanning electron microscopy (SEM) images of a SiC nanoneedle of sample S1 under different magnifications. (a4) Typical transmission electron microscopy (TEM) image of a SiC nanoneedle. (a5) High-resolution TEM image recorded from the marked area A in a4. (b1, b2) SEM images of the SiC nanowire of sample S2 under different magnifications. (c1, c2) SEM images of the SiC nanowire of sample S3 under different magnifications.

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