Figure 2
From: Highly flexible and robust N-doped SiC nanoneedle field emitters
(a) X-ray diffraction patterns of samples S1, S2 and S3. (b) Enlarged view showing the shift of (111) diffraction peaks as a result of different N-doping levels. (c) Survey XPS spectra, along with the spectra of (d) Si 2p, (e) C 1s, and (f) N 1s.
