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Figure 1

From: Gate-tunable quantum oscillations in ambipolar Cd3As2 thin films

Figure 1

Characterizations of as-grown Cd3As2 thin films. (a) A typical HRTEM image of Cd3As2 thin films, revealing a single crystalline structure. Inset: selected-area electron diffraction pattern. (b) The amplified image in the red box in panel (a) perfectly agreeing with the atom columns cleaving from the original crystal cell mode of Cd3As2 in panel (e) along (112) plane. (c) AFM image of the thin film surface. The RMS was determined to be ~0.3 nm. Inset: in-situ RHEED pattern during growth. (d) XRD spectrum. The marked peaks are the typical XRD patterns from Cd3As2 with a (112) plane of sample surface, while other peaks come from the mica substrate. (e) Simulated crystal structure of Cd3As2.

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