Figure 4
Synchrotron radiation X-ray diffraction (SR-XRD) profiles of h-BN film grown on Ni(111) substrate. (a) θ–2θ scan of as-grown h-BN/Ni(111). (b) Grazing incident diffraction (GID) profile of h-BN/Ni(111) with different X-ray azimuthal angles, separated by 30°. (c) Azimuthal angle(φ)-scan of h-BN{10
0} plane from as-grown h-BN/Ni, showing six-fold symmetry. (d) HK-mesh contour maps of reciprocal space mapping (RSM) around h-BN(11
0) and Ni(20
) diffraction peaks. h-BN, hexagonal boron nitride.
