Figure 2

Controllability of circularity in asymmetric disk arrays with different geometries. (a) MTXM images of in-plane domain structures taken from four successive measurements by alternating positive and negative field sequences in the disk arrays with R=500 nm, h=100 nm and d=200 nm. (b) Controllability of circularity by altering the direction of the applied field investigated in disk arrays (R=500 nm, d=200 nm) with different edge ratios and disk heights. The values are obtained from statistical analysis of generation probabilities of c in 1000 vortex formation events for each array. The error bar represents the standard deviation of controllability in 25 individual disks.