Figure 2
From: In situ TEM study of deformation-induced crystalline-to-amorphous transition in silicon
In situ observation of the CAT process during uniaxial compression recorded in the real and reciprocal space. (a) Engineering stress-strain curves of sample-1 (red) and sample-2 (black) with effective diameter d~152 nm. The insets are the bright-field transmission electron microscope images of sample-1 before and after loading. (b) Extracted snapshots from the recorded movie showing the amorphization evolution with increasing engineering strain ɛ. The accumulation of slip bands along {111} planes (orange dashed lines) leads to amorphization at the deformation front. (c) Selected area electron diffraction patterns (SAEDPs) corresponding to (b) with the same ɛ. Note that there were no new spots of any other intermediate crystalline phases during the entire CAT process. a-Si, amorphous Si; CAT, crystalline-to-amorphous transition. ZA, zone axis.
