Figure 1
From: Enhanced black state induced by spatial silver nanoparticles in an electrochromic device

Characterization of indium tin oxide (ITO) branches. (a) Top-view and cross-sectional scanning electron microscope (SEM) images of different thickness achieved by electron beam evaporation. Scale bar, 500 nm. (b) High-resolution transmission electron microscope (TEM) images and electron diffraction pattern (inset) indicate well-crystallized ITO with (100) orientation (lattice constant: d=0.509 nm). (c) Transmittance in the visible spectrum (400⩽λ⩽700 nm) of ITO branches of a range of thickness grown on the flat ITO (λ: wavelength).