Figure 4

Defective barrier function of tight junction induced by COM crystals. Polarized MDCK cells were grown in Transwells, and transepithelial resistance (TER) was measured at various time points after exposure to 100 μg/ml COM crystals. The polarized MDCK cells grown in COM-free medium (to which 100 μg/ml COM crystals were added and incubated for 30 min, but were then removed) served as the controlled cells. The data are reported as mean±s.e.m. (n=3 independent experiments for each data point). ^* Represents P<0.005 and ^** represents P<0.0005 compared with TER of controlled cells at the matched time point, whereas # represents P<0.005 compared with the basal TER level.