Figure 4
(a) AFM image of a SiC grating. (b) Spatial distribution of emissivity for three different wavelengths from Ref. 6. AFM, atomic force microscope.
Figure 4 | Light: Science & Applications
(a) AFM image of a SiC grating. (b) Spatial distribution of emissivity for three different wavelengths from Ref. 6. AFM, atomic force microscope.
