Figure 4
From: Ultrafast lasers—reliable tools for advanced materials processing
SEM images of nanoripples formed on Si by irradiation with linearly polarized 170 fs laser pulses with a wavelength of 800 nm and an energy per pulse of 3 nJ. (a) High-resolution image. (b) Image of wider area.54 Reproduced with permission from OSA. ©2011 by the Optical Society of America. SEM, scanning electron microscopy.
