Figure 1
From: Optical tuning of exciton and trion emissions in monolayer phosphorene
Robust identification of mono- and few-layer phosphorene by PSI. (a) Optical microscope image of a monolayer phosphorene (labeled as “1L”). Inset is the schematic of single-layer phosphorene molecular structure. (b) PSI image of the dash line box area indicated in a. (c) PSI measured OPL values along the dash line indicated in b. Inset is the schematic plot showing the PSI measured phase shifts of the reflected light from the phosphorene flake (ΦBP) and the SiO2/Si substrate (
). (d) OPL values from simulation and experiment PSI measurements for phosphorene samples from 1L to 6L. For each layer number of phosphorene, at least five different samples were characterized for the statistical measurements. The red dash line is the linear trend for statistical data measured with the PSI system.
