Figure 6
Orientation-controlled rotation of chiral microstructures by changing the phase value of the plane wave. (a) The phase of the interfering plane wave increases from 0 to 2π, as indicated by an arrow with a color gradient. The simulated intensity patterns (b) rotate in coincidence with the measurements (c). (Scale bar, 1 mm) (d) Rotation of the chiral microstructures with l=3. Rotating angle (Ra) of the simulated and measured intensity patterns. The measured values of the microstructures are a function of the phase value of the plane wave with l=3, 4 (e) and −3, −4 (f). The solid line represents the simulated Ra. The squares and circles denote the measurements of the optical intensity distributions and chiral microstructures, respectively. Vertical dashed lines indicate ∅0=2π, for which the largest rotating angles are generated.
