Figure 4
From: X-ray focusing with efficient high-NA multilayer Laue lenses
Diffraction efficiency of the (a) vertical and (b) horizontal lenses, as determined by the far-field 1D diffraction pattern of each lens at 16.3 keV photon energy, mapped as a function of tilt of the MLL lens. (c) Maps of the relative diffraction efficiency of the two lenses combined, from the far-field 2D diffraction pattern as a function of photon energy, ranging from 15.5 to 17.5 keV. All intensity maps are shown on a linear color scale. The side of the square pupil corresponds to 20 mrad (at 16.3 keV), and it scales inversely with photon energy.
