Figure 5
From: X-ray focusing with efficient high-NA multilayer Laue lenses
(a) Wavefront error in the pupil plane of the MLL showing significant error at the edges of the lenses. (b) The unwrapped wavefront separated into 1D phase profiles of each individual lens, and the differences in the phase error of the two lenses (dashed line) indicate an upper limit of the manufacturing reproducibility. (c) Reconstructed intensity in the MLL focus as determined by ptychography. Lineouts in horizontal (d) and vertical directions (e) of the in-focus intensities (black dots) were fitted with Gaussian functions (red lines) with widths of 8.4 and 6.8 nm, respectively. The color bars in (a) and (c) indicate the normalized phase and intensity.
