Extended Data Figure 3: TEM analysis showing non-basal deformation mechanisms in a polycrystalline sample under microcompression. | Nature

Extended Data Figure 3: TEM analysis showing non-basal deformation mechanisms in a polycrystalline sample under microcompression.

From: Processing and properties of magnesium containing a dense uniform dispersion of nanoparticles

Extended Data Figure 3

a, Bright-field TEM image showing a SiC nanoparticle embedded in the magnesium matrix. b, High-resolution TEM image from the region highlighted in a showing dislocations (indicated in yellow) terminated at stacking faults on the pyramidal planes in a grain oriented to the zone axis as indicated by its fast Fourier transform in c. The angle between the loading and pyramidal directions is around 30°.

Back to article page