Figure 2: Temperature-dependent high-resolution CL spectroscopy of a nanorod +c top-plane and m side-plane. | Nature Communications

Figure 2: Temperature-dependent high-resolution CL spectroscopy of a nanorod +c top-plane and m side-plane.

From: Arbitrary cross-section SEM-cathodoluminescence imaging of growth sectors and local carrier concentrations within micro-sampled semiconductor nanorods

Figure 2

(a) Bird’s-eye view SEM image of a ZnO nanorod investigated by Area-CL spectroscopy. E-beam scan areas on +c top-plane and m side-plane are indicated by transparent purple boxes. A horizontal scale bar indicates length of 0.5 μm. (b) Area-CL spectra on +c and m planes at 300, 80 and 10 K, probed by 3.0 keV e-beam. CL peaks are assigned to free exciton (FX), neutral donor-bound exciton (D0X), its nth LO phonon replica (D0X-nLO) and its two electron satellite (TES-D0X). (c) Detailed temperature dependence of Area-CL spectra between 80 and 300 K. Emergence of the redshifted FX peak is clearly observed. (d) Correlation between FX peak energy EFX (eV) and carrier electron concentration n (cm−3). Residual carrier concentrations n of +c and m growth sectors are evaluated using their correlation: EFX(n)=3.307–8.39 × 10−15n2/3-3.64 × 10−8n1/3 (ref. 61).

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