Figure 4: High-resolution cross-sectional CL imaging of a micro-sampled nanorod. | Nature Communications

Figure 4: High-resolution cross-sectional CL imaging of a micro-sampled nanorod.

From: Arbitrary cross-section SEM-cathodoluminescence imaging of growth sectors and local carrier concentrations within micro-sampled semiconductor nanorods

Figure 4

SEM and CL (NBE/Visible) images of first axial cross-section (a) and those of second basal cross-section (b), both of which are probed by 3.0 keV e-beam. Original nanorod volume is indicated by dashed line for eye-guide. (c) NBE CL profiles P1–P3 along coordinates Z at P1–P3 in a. CL spatial resolution is evaluated from FWHM of profile P3 around the sharpest CL spot. (d) CL (Panchromatic/NBE/Visible) profiles along coordinate X. (e) Schematic representation of +c and m growth sectors within the nanorod cross-section, revealed from comparison between SEM and NBE CL images. Nanorod bottom (Z=ZA) and slight NBE CL intensity drop in +c growth sector (Z=ZB) are also indicated in c,e. CL profiles P1–P4 and a hexagonal nanocolumn at earlier growth stage are indicated by aqua zones and schematically by an aqua box in a +c growth sector. All scale bars indicate lengths of 0.5 μm. (f) Schematic illustration of spatial distribution and shape of CL spots. Observed CL spots in ac are indicated by solid arrows and categorized into either spot A or spot B by their shape and location.

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