Figure 1: Optical and atomic force microscopy of a self-rotating flake. | Nature Communications

Figure 1: Optical and atomic force microscopy of a self-rotating flake.

From: Macroscopic self-reorientation of interacting two-dimensional crystals

Figure 1

(a) Optical microscopy image of the flake, demonstrating a very clean interface (bubble free) between graphene and hBN (the scale bar is 20 μm). Different colours correspond to different thicknesses of hBN. Graphene is practically invisible and is marked by red dashed line. The hatched area is bilayer graphene. (b,c) Young modulus distributions obtained in PeakForce Tapping mode of the moiré superlattice before (b) and after (c) self-alignment. The scale bar in b and c is 10 nm. (d,e) Line profiles across the respective Young’s modulus distribution images, which indicates the smaller width of the Young’s modulus peaks in the annealed (self-rotated) sample. Symbols—experimental data, solid curves—fitted peaks.

Back to article page