Figure 3: The T-dependence of switching.
From: Fast electronic resistance switching involving hidden charge density wave states
(a) The pulsed V–I characteristic as in Fig. 2, measured at different temperatures and at 10 K intervals with τpulse=50 μs. The V–I curve is measured in pulsed mode, by increasing the current incrementally and measuring the voltage at each point. The resistance drops sharply in a few consecutive measurements at the critical value of IT. The sample was reset in between each V–I curve by heating it above 310 K and then cooling down to the indicated temperature for the next measurement. (b) IT and V0 as a function of temperature. Error bars are obtained from fitting the data with the exponential function.
