Figure 1: Structure and characterization of ZrSiS single crystals.
From: Dirac cone protected by non-symmorphic symmetry and three-dimensional Dirac line node in ZrSiS
(a) Crystal structure of ZrSiS. The Si square net can be seen in blue. (b) SEM image of a typical crystal. The scale bar corresponds to 0.5 mm. (c) Low-energy electron diffraction (LEED) pattern of a cleaved crystal showing that it cleaves perpendicular to the c axis. (d) HRTEM image of the [110] orientation, inset shows simulated HRTEM image. The scale bar corresponds to 2 nm. The focus plane is Δf=−50 nm, close to the Scherzer focus, where atoms appear in black. Individual atoms could be identified and the cleavage plane between sulfur atoms is visible in white. For images with different foci and their simulations see Supplementary Fig. 2. (e) HRTEM image and PED pattern of the (001) surface, the square arrangement of atoms is clearly visible. The scale bar corresponds to 1 nm.
