Figure 3: Morphology study of MOF thin films prepared at different voltages.

SEM images of MOF thin films prepared at (a) 1 V; (b) 2 V; and (c) 3 V for 60 s and AFM deflection images of MOF thin films prepared at (d) 1 V; (e) 2 V; and (f) 3 V for 60 s. Scale bar, 1 μm (a–f).