Figure 7: Mechanical properties and leak current measurements of the MOF films. | Nature Communications

Figure 7: Mechanical properties and leak current measurements of the MOF films.

From: Integration of metal-organic frameworks into an electrochemical dielectric thin film for electronic applications

Figure 7

(a) Representative P (load)-h (h=indentation depth) curves for MOF films. Inset: elastic moduli E of MOF films as a function of the indentation depth, wherein each error bar represents the standard deviation from 11 indents. Error bars=s.d. (b) Representative current-voltage curves for a MOF thin film.

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