Figure 4: Negatively correlated electrical and thermal conductivity.

(a) Thermal conductivity measurements for 16- and 22-nm-thick SnS2 samples compared with bulk SnS2 reported values. (b) Scanning electron microscopy image used for MTMP setup and precise thermal conductivity measurement. Scale bar, 30 μm. (c) Electrical conductivity measurements for different thickness of SnS2 showing a large increase below 16 nm. The median value of three samples is shown by open circles, whereas error bars indicate the maximum and minimum values from each sample. (d) Open circuit voltage (Voc=63 mV) measurement of 16-nm SnS2 sample under illumination by 405-nm laser (power of 45 μW). (e) Simulated ΔT for SnS2 samples illuminated by the same laser as left-hand side figure. (f) Calculated ZT values for temperatures from 100 to 300 K.