Figure 1: Material synthesis and characterization.

(a) Optical photograph of as-prepared TiS3 whiskers in the sealed quartz ampule and (inset) zoom-in images of TiS3 whiskers that were grown at the interior surface of quartz. Scale bar, 250 μm. (b) Schematic cross-section schematic view of TiS3 chains along the b axis, with Ti atoms in blue and S atoms in yellow. (c) Optical image of typical TiS3 whiskers exfoliated on SiO2/Si substrates with large geometrical anisotropy along the b axis crystalline direction. Scale bar, 20 μm. (d) Atomic force microscope image of exfoliated TiS3 whiskers with thickness ∼15 nm. Scale bar, 1 μm. (e) High-resolution transmission electron microscopy image of TiS3 whiskers, and corresponding fast Fourier transform (FFT) image (inset). Scale bar, 1 nm. (f) X-ray powder diffraction pattern of TiS3.