Figure 5: X-ray diffraction characterization of LixMoS2 samples.
From: Tuning thermal conductivity in molybdenum disulfide by electrochemical intercalation
(a) X-ray diffraction spectra for MoS2 thin-film samples on sapphire substrate. The two diffraction peaks coincide with the standard X-ray diffraction powder patterns of MoS2 (100) and (110). Therefore, the dominant lattice orientation in the MoS2 thin-film samples are (100) and (110). The diffraction peak at 32.8° and 58.5° corresponds to a lattice constant of 2.73 and 1.58 Å, respectively. (b) Lattice spacing d between MoS2 layers in bulk MoS2 samples. The error bars are calculated by taking into account the experimental errors and the systematic errors that propagate from uncertainties in the fitting of X-ray diffraction spectra. The inset plot is the change of MoS2 (002) peak position with x in LixMoS2.
