Figure 1: Microsphere-based SSUM.
From: Scanning superlens microscopy for non-invasive large field-of-view visible light nanoscale imaging
(a) Schematic of the construction of a microsphere-based SSUM that integrates a microsphere superlens into an AFM scanning system by attaching the microsphere to an AFM cantilever. The objective picks up the virtual images containing sub-diffraction-limited object information and simultaneously focuses and collects the laser beam used in the cantilever deflection detection system. (b) An original virtual image observed using the microsphere superlens. The inset shows an SEM image. (c,d) Backside and frontside images, respectively, of the AFM cantilever with an attached microsphere superlens. Scale bars, 2 μm (b); 50 μm (c,d).
