Figure 1: Basic device characteristics. | Nature Communications

Figure 1: Basic device characteristics.

From: Suppressed decomposition of organometal halide perovskites by impermeable electron-extraction layers in inverted solar cells

Figure 1

Scanning electron microscopy (SEM) image of the device cross-section along with the assignment of the respective layers (a). In some devices, the SnOx or the AZO layer has been omitted. Note that the contrast between the AZO and the SnOx layers in SEM is relatively poor. External quantum efficiency (EQE) of a representative device based on AZO/SnOx (b). J/V characteristics measured in forward and reverse direction (c), and current density versus time under 0 V (black) and 0.75 V (red) bias (d).

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