Figure 3: Deconvolved power distributions.
From: Super-resolution imaging of light–matter interactions near single semiconductor nanowires
Simulated power distributions for TM, (a) and TE, (b) polarizations. Neglecting the excitation laser influence for clarity, fluorophore total emission due to enhancement (or quenching) by the wire (blue line) and the observable peak intensity of a Gaussian fit to the point spread function (PSF) image (pink line) are shown. The power difference between these two traces is shown divided between the coupling to waveguide modes and the redirection of emission by scattering (blue and pink shaded regions, respectively). The above are taken with respect to the true dipole positions, with the final bottom green trace showing the locations when the PSF displacements are included. (c) Image plane simulations of PSF modification by interaction of a z dipole with the nanowire, showing peak displacement from the true dipole position (white line) as well as geometric distortions (which also decrease the peak intensity).
