Figure 1: Characterization of SLG on electron-doped PCCO.

(a) Schematic of SLG (hexagonal lattice) on PCCO/STO. (b) High-angle X-ray diffraction data on four control films of 5 mm × 5 mm PCCO/STO deposited using identical growth conditions (curves are vertically offset for clarity). (c–f) Rocking curves (omega scans) of the (006) PCCO diffraction peaks from the same samples investigated in (b) with matching colours showing a FWHM of 0.85° (c), 0.42° (d), 0.51° (e) and 0.61° (f). (g) STM topography map showing SLG on PCCO/STO measured at 4.2 K (scale bar in g has a length of 0.5 nm). (h) Raman spectra at 514.5 nm of PCCO as-grown on STO (grey) and following transfer of SLG (red) at 293 K. (i) Raman spectra at 514.5 nm of SLG as-grown on Cu (grey) and following transfer onto PCCO/STO (red) measured at 293 K. The PCCO/STO background is subtracted to allow identification of D, G and 2D peaks. (j) Raman spectra at 514.5 nm of SLG on PCCO/STO, after background subtraction, at 293 K (red), 150 K (blue) and 4.2 K (light blue).