Figure 1: Experimental setup and sample information.
From: Effect of hydrogen on the integrity of aluminium–oxide interface at elevated temperatures
(a) Optical image of the front end of the TEM specimen holder with a home-made MEMS heating chip mounted inside. (b) Enlarged view of the area indicated by white rectangle in (a) showing the heating/sensing traces and sample mounting bars in the hotplate of the MEMS heating chip. (c) SEM image of the sample-mounting area as outlined by a white square in (b) with two lift-out aluminium plates attached at both sides. The Al pillars are directly fabricated on the Al plates using FIB. (d) SEM image of a typical FIBed pillar viewed from 45°. The pillar is ∼250 nm in diameter with an axial direction of [110]. The pillar is viewed from the 
direction in TEM. Scale bar: (b) 200 μm, (c) 30 μm, (d) 500 nm.
