Figure 4: Bulk characterization of Bi1Te1 thin films. | Nature Communications

Figure 4: Bulk characterization of Bi1Te1 thin films.

From: Bi1Te1 is a dual topological insulator

Figure 4

(a) Comparative XRD ω/2θ scans for both Bi2Te3 and Bi1Te1 films averaged over the entire crystal (b,c). 2D reciprocal space maps obtained around the (1,0,−1,20) reflection for Bi2Te3 (b) and the (1,0, −1,16) reflection for Bi1Te1 (c) with derived lattice constants a and c from Gaussian fits. (d) Local STEM image of a 39-nm-thick Bi1Te1 film confirming the high bulk crystalline quality. The contrast in the image scales with the atomic number squared (Z2), that is, bright=Bi, darker=Te. QLs and Bi BLs separated by van der Waals gaps can be identified. The yellow frame marks the region over which the line profile below is measured while averaging in the vertical direction. QLs and BLs are denoted and Bi and Te atomic layers are displayed by orange and green columns, respectively.

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