Figure 4: The reciprocal space maps of SrRuO₃/SrTiO₃ and SrRuO₃/DyScO₃.

The reciprocal space maps were taken around the (104) reflection of (a) SrTiO₃ and (b) DyScO₃. The corresponding radial scans along the horizontal vector, H=1 (the vertical dashed lines), with four orthogonal angles, φ=0^o (black line), 90^o (green line), 180^o (orange line) and 270^o (red line), were collected to inspect the domain structures of SrRuO₃ thin films grown on (c) SrTiO₃ and (d) DyScO₃ substrates, respectively. In (c), the shift in peak due to the tilted angle along the a axis of SrRuO₃ is labelled as I and III. Position II represents diffraction characteristics from the b axis of SrRuO₃.