Figure 1: Structural characteristics and X-ray imaging of domain patterns.
From: Spin-orbit torque-driven skyrmion dynamics revealed by time-resolved X-ray microscopy
(a) Out-of-plane hysteresis loop for a companion multilayer film grown on Si wafer. The magnetic moment is normalized to its saturation magnetization MS=9 × 105 A m−1. The inset shows both in-plane and out-of-plane hysteresis loops for a Pt/CoFeB/MgO unit layer grown on Si wafer. (b) Series of magnetic transmission soft X-ray microscopy (MTXM) images acquired for increasing field Bz>0. Dark and light contrast corresponds to down (−z)- and up (+z)-oriented magnetization directions, respectively. Scale bar, 200 nm. (c) MTXM image acquired at Bz=+25 mT and the schematic of the expected chiral magnetic textures.
