Figure 3: Transmission electron micrographs of recrystallized W tips processed by FDSS.
From: Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography
(a) TEM image of tip Z1 before sharpening. (b) TEM image of tip Z2 before sharpening. (c) TEM image of tip Z3 before sharpening. (d) TEM image of tip Z1 after sharpening. All tips processed under identical conditions (1.5 keV ion energy, Vr=0.1). (e) TEM image of tip Z2 after sharpening. (f) TEM image of tip Z3 after sharpening. (g) TEM image of tip Z4 after FDSS over a short-time interval (40 min). (h) TEM image of tip Z4 after additional FDSS over a long time-interval (4 h total). All scale bars, 10 nm.
