Figure 5: STM and constant spacing STS of the Si(100) 2×1:H surface using W-HfB2 STM tips.
From: Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography
(a) STM image demonstrating high stability and consistent dimer row resolution, with the locations of STS data collection denoted in red. Black crosshairs represent data points, which were excluded due to the presence of a dangling bond directly beneath the probe. Topographic data were collected with a sample bias of −2 V and current set point of 50 pA. Scale bar, 10 nm. (b) STS data on a semi-log plot. The average of the 14 spectra points is shown in black, with the individual spectra shown in grey.
