Figure 2: Dielectric relaxation characteristics of junctions. | Nature Communications

Figure 2: Dielectric relaxation characteristics of junctions.

From: Dynamics of multiple phases in a colossal-magnetoresistive manganite as revealed by dielectric spectroscopy

Figure 2

(a–c) Frequency dependence of imaginary (C″) part of complex capacitances at various temperatures for manganite films; (a) PCMO, (b) and (c) PCSMO. Blank, half-filled and filled triangles indicate different loss peaks of C″ (relaxation τ1, τ2 and τ3, respectively). Red arrows indicate the movement of loss peaks with decreasing temperature. (d–f) The corresponding Cole–Cole plots (C′ versus C″); (d) PCMO, (e) and (f) PCSMO. The solid lines are fitting results according to the Davidson–Cole model (see text). The Davidson–Cole parameter β obtained from fitting results is ~0.5 for PCMO. For PCSMO, it is about 0.85 for relaxation τ1, about 1 for relaxation τ2 and as small as 0.43 for relaxation τ3. The labels τ1, τ2 and τ3 in e and f indicate the corresponding arcs in Cole–Cole plots for different relaxation τ1, τ2 and τ3, respectively.

Back to article page