Figure 3: Magnetic field dependence of dielectric relaxations.

Frequency dependence of C″ under various magnetic fields for (a) PCMO and (b) PCSMO samples measured at T=150 K. Red dashed arrows in b indicate the movement of loss peaks with increasing magnetic field. (c) Magnetic field dependence of resistivity for PCMO (black) and PCSMO (red) films measured at T=150 K. (d) Magnetic field dependence of relaxation time τ for PCMO (black) and PCSMO (red) junctions measured at T=150 K. The red curves in d with squares and circles present results for relaxation τ1 and τ2 of PCSMO junction, respectively. In both c and d, the red arrows indicate the scan direction of magnetic field.