Figure 4: XLD signal versus strain.
Integrated area of the X-ray linear dichroism (XLD) signal as a function of lattice mismatch between La2/3Sr1/3MnO3 and substrates. Negative values indicate preferential occupation of in-plane x2-y2 orbitals, while positive values indicate preferential occupation of 3z2-r2 orbitals. The dashed line is the expected variation of the integrated area due to strain effect; the arrows indicate the shift induced in the XLD spectra by the free-surface contribution. In the bottom inset the integration range (energy region of the L2 peak) is indicated. Top inset: area under the XLD spectra as a function of thickness for samples grown on (001)SrTiO3 substrates, including single terminated samples (crosses, as indicated in main panel legend).
