Figure 5: XLD signal versus thickness of the samples. | Nature Communications

Figure 5: XLD signal versus thickness of the samples.

From: Surface symmetry-breaking and strain effects on orbital occupancy in transition metal perovskite epitaxial films

Figure 5

(a) Right axis (symbols): integrated area of the X-ray linear dichroism (XLD) signal of the samples grown on SrTiO3 (001), (LaAlO3)0.3-(Sr2AlTaO6)0.7 and NdGaO3 substrates. Left axis (dashed lines): best fits of area under XLD signal to multilayer model as explained in the text. (b) Sketch of the model representing the contribution of the MnO2 layers at a position ti (i=1…n, where tn is the depth of the last layer of the film), having orbital occupancies P(3z2-r2)and P(x2-y2), to the measured intensity (Ii). PS and Pb represent the difference of occupancies (P(3z2-r2)-P(x2-y2))at the surface (i=1) and at the bulk of the film (i>1). The exponential term reflects the attenuation (δ) of the outcoming signal.

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