Figure 4: Azimuthally averaged single-particle diffraction patterns.
From: Single-particle structure determination by correlations of snapshot X-ray diffraction patterns
(a) Model partial scattered intensities (solid lines in Fig. 3) are used for calculation of diffraction pattern. (b) Diffraction pattern is assembled from the experimental partial scattered intensities (circles in Fig. 3) obtained by correlation analysis of randomly orientated diffraction patterns. Inset shows the image of azimuthally averaged electron density reconstructed from the experimental pattern. Scale bar is 10 nm.
