Figure 1: Back-scattered electron images.

(a) One shock vein intersects the other shock vein. White arrows indicate silica grains entrained in the crossed shock veins. (b) Magnified image of the boxed area in (a). (c) A silica grain adjacent to a shock vein. (d) A silica grain far from a shock vein. TEM slices prepared using a FIB are indicated by white boxes with numbers. Cri, cristobalite; Coe, coesite; Sti, stishovite; α-PbO2, seifertite; SiO2-Gla, silica glass; Ol, olivine; Pyx, pyroxene; Pla, plagioclase glass; Ilm, ilmenite.