Figure 5: Measured cross-correlation S(Δt) on silicon nitride membrane.
From: Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers
The sample thickness was 20 nm. The measured (white rectangles) and fitted (blue line) cross-correlation at 5.5 nm FEL wavelength is shown. The retrieved pulse duration is τFEL=(34±19) fs. The grey data scattering originates from small fluctuations in spatial beam profile features (optical laser and FEL) between two shots taken for the background subtraction. The measurements on this sample were nondestructive. This enables the implementation of this method as an online tool for pulse duration and arrival time measurements.
