Figure 1: Transport data and XSTM and dI/dV mapping at 3.0 V of the YBCO/LCMO superlattice.

(a) Resistance versus temperature measurement showing a superconducting critical temperature around 70 K (64–77 K, shadowed region). (b) Schematic of cross-sectional scanning tunnelling microscopy (XSTM) on the YBCO/LCMO superlattice grown on a Nb-doped STO substrate. (c) XSTM topography and (d) dI/dV mapping at +3.0 V measured at 56 K. (c) Scale bar, 100 nm.