Figure 6: Gating efficiency for various gating methods. | Nature Communications

Figure 6: Gating efficiency for various gating methods.

From: Large modulation of zero-dimensional electronic states in quantum dots by electric-double-layer gating

Figure 6

(a) Pinch-off back-gate voltage, VBG, as a function of VEDL. The dashed line is a guide for eyes. (b) Comparison of the lever-arm factors for various gating methods. The lever-arm factor is defined as the conversion ratio of the gate voltage to the shift in the energy levels. The lever-arm factor for the side gate was derived from Deacon et al.13 and Kanai et al.15 The lever-arm factor for the back-gate was derived from this work (αBG ~70 meV V−1) and Takahashi et al.14 The lever-arm factor for the top-gate structure was derived from Supplementary Fig. S9. The efficiency of EDL gating (350 meV V−1) is about 6, 9 and 90 times higher than that of the back gating (60 meV V−1), the top gating (40 meV V−1) and the side gating (4 meV V−1), respectively. In order to compare the lever-arm factors for different gating methods, we carefully chose the samples with almost the same nano-gap size (50 nm) and the QD location relative to the nano-gap electrodes (The QD is located at the centre of nano-gap metal electrodes as shown in Fig. 1c).

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